Jaesung Lee, Kwangsoo Kim, Jinsu Han, Jaegab Kim, and Hunsub Park
"Electrical Characteristics of Ti-Salicided n-MOSFETs with Asymmetric Source/Drain 
 Regions "
International Symposium on VLSI Technology, Systems, and Applications, 
Taiwan, June, 1997.                    

J.S Lee, H.S.Park
"Electrical Property of Thin Dielectrics Applied for double poly silicon analog 
capacitors,"
International Symposium on the Physics of Semiconductors and 
Applications, Korea, pp.71-72, November, 1998.                        

J. S. Lee and B. K. Jun
"Analysis of parasitic resistance by source/drain geometry in abnormally 
structured MOSFET's,"
International Symposium on the Physics of
Semiconductors and Applications, Korea, pp. 70-71, November, 2000.                      

J. S. Lee, H. G. Ahn, and W. G. Lee
"A thorough study of thin gate oxide degradation during fabrication of advanced 
CMOSFET's," 
2001 Asia-Pacific Workshop on Fundamental and Application of 
Advanced Semiconductor Devices, pp. 65-69, July, 2001.                      

H. H. Park, J. S, Lee, S. Nahm, K. I. Cho, K. S. Kim, and Y. H. Lee,  "Investication 
on the interfacial reaction of SiO2/Ti0.1W0.9 system ", E-MRS, spring meeting, 
France, April, 1994                      

H. H. Jeong, S. K. Kim, J. S. Lee, H. C. Choi, J. H. Lee, and Y. H. Lee, " 
Investigation of dopant dependent wave velocity in GaN thin film SAW filter," 2001 
IEEE International Ultrasonic Symposium A Joint Meeting with the World Congress on 
Ultrasonics, October, 2001.                       

Jae-Sung Lee, Karl Hess, and J. Lyding, "Hydrogen-related extrinsic oxide trap 
generation in ultra thin SiO2 during negative-bias temperature instability stress," 
2004 IRPS