Conference(ÇØ¿Ü) |
1.
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Jaesung Lee, Kwangsoo Kim, Jinsu Han, Jaegab Kim, and Hunsub Park
"Electrical Characteristics of Ti-Salicided n-MOSFETs with Asymmetric Source/Drain
Regions "
International Symposium on VLSI Technology, Systems, and Applications,
Taiwan, June, 1997.
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2.
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J.S Lee, H.S.Park
"Electrical Property of Thin Dielectrics Applied for double poly silicon analog
capacitors,"
International Symposium on the Physics of Semiconductors and
Applications, Korea, pp.71-72, November, 1998.
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3.
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J. S. Lee and B. K. Jun
"Analysis of parasitic resistance by source/drain geometry in abnormally
structured MOSFET's,"
International Symposium on the Physics of
Semiconductors and Applications, Korea, pp. 70-71, November, 2000.
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4.
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J. S. Lee, H. G. Ahn, and W. G. Lee
"A thorough study of thin gate oxide degradation during fabrication of advanced
CMOSFET's,"
2001 Asia-Pacific Workshop on Fundamental and Application of
Advanced Semiconductor Devices, pp. 65-69, July, 2001.
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5.
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H. H. Park, J. S, Lee, S. Nahm, K. I. Cho, K. S. Kim, and Y. H. Lee, "Investication
on the interfacial reaction of SiO2/Ti0.1W0.9 system ", E-MRS, spring meeting,
France, April, 1994
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6.
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H. H. Jeong, S. K. Kim, J. S. Lee, H. C. Choi, J. H. Lee, and Y. H. Lee, "
Investigation of dopant dependent wave velocity in GaN thin film SAW filter," 2001
IEEE International Ultrasonic Symposium A Joint Meeting with the World Congress on
Ultrasonics, October, 2001.
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7.
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Jae-Sung Lee, Karl Hess, and J. Lyding, "Hydrogen-related extrinsic oxide trap
generation in ultra thin SiO2 during negative-bias temperature instability stress,"
2004 IRPS
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