Publications

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Conference(ÇØ¿Ü)

1.

Jaesung Lee, Kwangsoo Kim, Jinsu Han, Jaegab Kim, and Hunsub Park "Electrical Characteristics of Ti-Salicided n-MOSFETs with Asymmetric Source/Drain Regions " International Symposium on VLSI Technology, Systems, and Applications, Taiwan, June, 1997.

2.

J.S Lee, H.S.Park "Electrical Property of Thin Dielectrics Applied for double poly silicon analog capacitors," International Symposium on the Physics of Semiconductors and Applications, Korea, pp.71-72, November, 1998.

3.

J. S. Lee and B. K. Jun "Analysis of parasitic resistance by source/drain geometry in abnormally structured MOSFET's," International Symposium on the Physics of Semiconductors and Applications, Korea, pp. 70-71, November, 2000.

4.

J. S. Lee, H. G. Ahn, and W. G. Lee "A thorough study of thin gate oxide degradation during fabrication of advanced CMOSFET's," 2001 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices, pp. 65-69, July, 2001.

5.

H. H. Park, J. S, Lee, S. Nahm, K. I. Cho, K. S. Kim, and Y. H. Lee, "Investication on the interfacial reaction of SiO2/Ti0.1W0.9 system ", E-MRS, spring meeting, France, April, 1994

6.

H. H. Jeong, S. K. Kim, J. S. Lee, H. C. Choi, J. H. Lee, and Y. H. Lee, " Investigation of dopant dependent wave velocity in GaN thin film SAW filter," 2001 IEEE International Ultrasonic Symposium A Joint Meeting with the World Congress on Ultrasonics, October, 2001.

7.

Jae-Sung Lee, Karl Hess, and J. Lyding, "Hydrogen-related extrinsic oxide trap generation in ultra thin SiO2 during negative-bias temperature instability stress," 2004 IRPS